Selective Optimization of Test for Embedded Flash Memory
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0-7803-7542-4/02 $17.00 © 2002 IEEE Panel P7.4 ITC INTERNATIONAL TEST CONFERENCE SELECTIVE OPTIMIZATION OF TEST FOR EMBEDDED FLASH MEMORY Roger Barth Intel Corporation The Problem Embedded memory has never been the easiest memory to test since it is generally hidden behind a large amount of intervening circuitry. Over the years, DAT (Direct Access Test) has eased the problem for the test engineer and BIST has enabled fast RAM based memory to self diagnose and in some cases repair during the power-up process.
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تاریخ انتشار 2002